MTI
Portable 4 Probe Resistivity Tester for Electrodes and Crystal Substrate and - EQ-JX2008-LD
Portable 4 Probe Resistivity Tester for Electrodes and Crystal Substrate and - EQ-JX2008-LD
EQ-JX2008-LD resistivity tester is a portable and multi-functional 4 probes resistivity testing instrument, which is based on the principle of the four-point probe measurement. It can be used to measure the radial and axial resistivity of the sheet or block semiconductor materials and is widely applied for filtration in semiconductor and solar industries.
Feature:
Preset the sample thickness with the self-correcting function
Measure the resistivity and show the value directly
Test the P/N type of semiconductor accurately
Set up the alarm threshold of the P/N type
Specifications:
Power Adaptor: Input: 100 - 240V AC, 50/60Hz, 0.8
Output: +15V, 2.0 A
Size: 155×120×50mm
Testing Range: 0.001-100 ohm-cm
Resistivity Testing Accuracy: ± 5% ± 2LSB
Minimum Testing Area: 10mm x 10mm
If the testing sample is smaller, you may order High Conductive Silver Epoxy ( click picture below right to order )and lead wire to extend the four contact points as the below picture.